{"id":151,"date":"2017-01-24T08:43:34","date_gmt":"2017-01-24T08:43:34","guid":{"rendered":"http:\/\/dummy.xtemos.com\/basel\/?p=151"},"modified":"2019-01-08T14:30:51","modified_gmt":"2019-01-08T14:30:51","slug":"wafer-inspection-scheme","status":"publish","type":"post","link":"https:\/\/www.sipotek.net\/wafer-inspection-scheme\/","title":{"rendered":"Wafer inspection scheme"},"content":{"rendered":"<p>Wafer Inspection Scheme Shenzhen SPOTECK Technology Co., Ltd., SPOTECK has been focusing on machine vision inspection for 13 years.<\/p>\n<p>There are a lot of testing cases, wide application areas, free sampling, development of testing programs, rapid outbound.<\/p>\n<p>&nbsp;<\/p>\n<p><img loading=\"lazy\" class=\"alignnone size-full wp-image-1893\" src=\"http:\/\/www.sipotek.net\/file\/2017\/01\/15353429281773.jpg\" alt=\"\" width=\"600\" height=\"337\" srcset=\"https:\/\/www.sipotek.net\/file\/2017\/01\/15353429281773.jpg 600w, https:\/\/www.sipotek.net\/file\/2017\/01\/15353429281773-300x169.jpg 300w\" sizes=\"(max-width: 600px) 100vw, 600px\" \/><\/p>\n<p>1. Contents and requirements of testing<\/p>\n<p>Measure workpiece area:<\/p>\n<p>Appearance and Dimension Detection of Samples 1.44mm in Length, 1.43mm in Width and 1.65mm in Height<\/p>\n<p>Detection Contents: Damage, cracks, stomata, poor nickel layer<\/p>\n<p>1: Bottom Positive Detection Appearance<\/p>\n<p>2: Side Positive Detection Appearance<\/p>\n<p>3: Side Positive Detection Appearance<\/p>\n<p>4: Side Positive Detection Appearance<\/p>\n<p>5: Side Positive Detection Appearance<\/p>\n<p>6: Top Positive Detection Appearance<\/p>\n<p>Note: The above detection items need to be clearly visible under the image to detect.<\/p>\n<p>Detection efficiency: 250-350 pieces per minute (according to sample feeding speed).<\/p>\n<p>Division of work: Subdivide the detection steps according to the detection content.<\/p>\n<p>II. Equipment Composition and Major Institutions<\/p>\n<p>Overall Composition: Dimension: 900*800*1850 mm<\/p>\n<p>Model: SP_T300<\/p>\n<p>1:SPOTECK Visual Detection Software<\/p>\n<p>2: industrial computer<\/p>\n<p>3: display 19 inches<\/p>\n<p>4: Industrial cameras: 6 sets, 1 bottom, 4 side and 1 top.<\/p>\n<p>5: Industrial Lens: 6 FA Industrial Lens<\/p>\n<p>6: professional glass tray<\/p>\n<p>7: solenoid valve<\/p>\n<p>8: reducer<\/p>\n<p>9: vibration cabinet<\/p>\n<p>10: Feeding Equipment (Vibrating Disk, Direct Vibration, Controller)<\/p>\n<p>II.1: 3-D Stereogram of Equipment Appearance<\/p>\n<p><img loading=\"lazy\" class=\"alignnone size-full wp-image-1879\" src=\"http:\/\/www.sipotek.net\/file\/2017\/01\/15353423662736.png\" alt=\"\" width=\"366\" height=\"494\" srcset=\"https:\/\/www.sipotek.net\/file\/2017\/01\/15353423662736.png 366w, https:\/\/www.sipotek.net\/file\/2017\/01\/15353423662736-222x300.png 222w\" sizes=\"(max-width: 366px) 100vw, 366px\" \/><\/p>\n<p>3:1 Bottom Positive Detection Method<\/p>\n<p>Bottom Test Fine Product Analysis Chart: OK<\/p>\n<p><img loading=\"lazy\" class=\"alignnone size-full wp-image-1894\" src=\"http:\/\/www.sipotek.net\/file\/2017\/01\/15353430426092.png\" alt=\"\" width=\"577\" height=\"433\" srcset=\"https:\/\/www.sipotek.net\/file\/2017\/01\/15353430426092.png 577w, https:\/\/www.sipotek.net\/file\/2017\/01\/15353430426092-300x225.png 300w\" sizes=\"(max-width: 577px) 100vw, 577px\" \/><\/p>\n<p>&nbsp;<\/p>\n<p>3:1 Bottom Positive Detection Method<\/p>\n<p>Bottom defective product analysis chart (fission): NG<\/p>\n<p><img loading=\"lazy\" class=\"alignnone size-full wp-image-1895\" src=\"http:\/\/www.sipotek.net\/file\/2017\/01\/15353430623997.png\" alt=\"\" width=\"577\" height=\"433\" srcset=\"https:\/\/www.sipotek.net\/file\/2017\/01\/15353430623997.png 577w, https:\/\/www.sipotek.net\/file\/2017\/01\/15353430623997-300x225.png 300w\" sizes=\"(max-width: 577px) 100vw, 577px\" \/><\/p>\n<p>3:1 Bottom Positive Detection Method<\/p>\n<p>Bottom defective product analysis chart (bad nickel layer): NG<\/p>\n<p><img loading=\"lazy\" class=\"alignnone size-full wp-image-1896\" src=\"http:\/\/www.sipotek.net\/file\/2017\/01\/15353430906145.png\" alt=\"\" width=\"577\" height=\"433\" srcset=\"https:\/\/www.sipotek.net\/file\/2017\/01\/15353430906145.png 577w, https:\/\/www.sipotek.net\/file\/2017\/01\/15353430906145-300x225.png 300w\" sizes=\"(max-width: 577px) 100vw, 577px\" \/><\/p>\n<p>&nbsp;<\/p>\n<p>3:2 Side Positive Light Detection Method<\/p>\n<p>Analysis Chart of Fine Products for Side Detection: OK<\/p>\n<p><img loading=\"lazy\" class=\"alignnone size-full wp-image-1897\" src=\"http:\/\/www.sipotek.net\/file\/2017\/01\/15353431183926.png\" alt=\"\" width=\"577\" height=\"433\" srcset=\"https:\/\/www.sipotek.net\/file\/2017\/01\/15353431183926.png 577w, https:\/\/www.sipotek.net\/file\/2017\/01\/15353431183926-300x225.png 300w\" sizes=\"(max-width: 577px) 100vw, 577px\" \/><\/p>\n<p>&nbsp;<\/p>\n<p>3:2 Side Positive Light Detection Method<\/p>\n<p>Side detection defective product analysis chart (breakage): NG<\/p>\n<p><img loading=\"lazy\" class=\"alignnone size-full wp-image-1898\" src=\"http:\/\/www.sipotek.net\/file\/2017\/01\/15353431457618.png\" alt=\"\" width=\"577\" height=\"433\" srcset=\"https:\/\/www.sipotek.net\/file\/2017\/01\/15353431457618.png 577w, https:\/\/www.sipotek.net\/file\/2017\/01\/15353431457618-300x225.png 300w\" sizes=\"(max-width: 577px) 100vw, 577px\" \/><\/p>\n<p>&nbsp;<\/p>\n<p>3:2 Side Positive Light Detection Method<\/p>\n<p>Top defective product analysis chart (stomata): NG<\/p>\n<p><img loading=\"lazy\" class=\"alignnone size-full wp-image-1899\" src=\"http:\/\/www.sipotek.net\/file\/2017\/01\/15353448671276.png\" alt=\"\" width=\"577\" height=\"433\" srcset=\"https:\/\/www.sipotek.net\/file\/2017\/01\/15353448671276.png 577w, https:\/\/www.sipotek.net\/file\/2017\/01\/15353448671276-300x225.png 300w\" sizes=\"(max-width: 577px) 100vw, 577px\" \/><\/p>\n<p>&nbsp;<\/p>\n<p>3:3 Side Positive Light Detection Method<\/p>\n<p>Analysis Chart of Fine Products for Side Detection: OK<\/p>\n<p><img loading=\"lazy\" class=\"alignnone size-full wp-image-1900\" src=\"http:\/\/www.sipotek.net\/file\/2017\/01\/15353448888840.png\" alt=\"\" width=\"577\" height=\"433\" srcset=\"https:\/\/www.sipotek.net\/file\/2017\/01\/15353448888840.png 577w, https:\/\/www.sipotek.net\/file\/2017\/01\/15353448888840-300x225.png 300w\" sizes=\"(max-width: 577px) 100vw, 577px\" \/><\/p>\n<p>3:3 Side Positive Light Detection Method<\/p>\n<p>Side detection defective product analysis chart (breakage): NG<\/p>\n<p><img loading=\"lazy\" class=\"alignnone size-full wp-image-1901\" src=\"http:\/\/www.sipotek.net\/file\/2017\/01\/15353449125964.png\" alt=\"\" width=\"577\" height=\"433\" srcset=\"https:\/\/www.sipotek.net\/file\/2017\/01\/15353449125964.png 577w, https:\/\/www.sipotek.net\/file\/2017\/01\/15353449125964-300x225.png 300w\" sizes=\"(max-width: 577px) 100vw, 577px\" \/><\/p>\n<p>&nbsp;<\/p>\n<p>3:3 Side Positive Light Detection Method<\/p>\n<p>Top defective product analysis chart (stomata): NG<\/p>\n<p><img loading=\"lazy\" class=\"alignnone size-full wp-image-1902\" src=\"http:\/\/www.sipotek.net\/file\/2017\/01\/15353449329323.png\" alt=\"\" width=\"577\" height=\"433\" srcset=\"https:\/\/www.sipotek.net\/file\/2017\/01\/15353449329323.png 577w, https:\/\/www.sipotek.net\/file\/2017\/01\/15353449329323-300x225.png 300w\" sizes=\"(max-width: 577px) 100vw, 577px\" \/><\/p>\n<p>&nbsp;<\/p>\n<p>IV. System Installation Requirements:<\/p>\n<p>Inspection space for equipment placement: Separately installing SP visual inspection system at the pipeline side, it is necessary to ensure that there is enough space to install the equipment.<\/p>\n<p>Ambient temperature: 0-50 degrees Celsius;<\/p>\n<p>Air humidity: below 90% RH;<\/p>\n<p>Electronic jamming: Provide equipment with less electronic jamming.<\/p>\n<p>Power supply: 220V, 50Hz AC, less than 1KVA power consumption, air pressure 0.35-0.7MPa<\/p>\n<p>Above is the wafer detection scheme, the main contents of detection are breakage, cracks, pore, poor nickel layer and size.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>A sodales suspen disse vestibulum dui ultrices ferm entum a parturient scele risque potenti placerat blandit purus adipiscing eros habitasse sodales<\/p>\n","protected":false},"author":1,"featured_media":1892,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":[],"categories":[1],"tags":[],"yst_prominent_words":[],"_links":{"self":[{"href":"https:\/\/www.sipotek.net\/rest\/wp\/v2\/posts\/151"}],"collection":[{"href":"https:\/\/www.sipotek.net\/rest\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.sipotek.net\/rest\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.sipotek.net\/rest\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.sipotek.net\/rest\/wp\/v2\/comments?post=151"}],"version-history":[{"count":2,"href":"https:\/\/www.sipotek.net\/rest\/wp\/v2\/posts\/151\/revisions"}],"predecessor-version":[{"id":1903,"href":"https:\/\/www.sipotek.net\/rest\/wp\/v2\/posts\/151\/revisions\/1903"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.sipotek.net\/rest\/wp\/v2\/media\/1892"}],"wp:attachment":[{"href":"https:\/\/www.sipotek.net\/rest\/wp\/v2\/media?parent=151"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.sipotek.net\/rest\/wp\/v2\/categories?post=151"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.sipotek.net\/rest\/wp\/v2\/tags?post=151"},{"taxonomy":"yst_prominent_words","embeddable":true,"href":"https:\/\/www.sipotek.net\/rest\/wp\/v2\/yst_prominent_words?post=151"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}